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Title:
Broad-Band Soft X-ray Polarimetry
Authors:
Marshall, Herman L.; Heilmann, Ralf; Schulz, Norbert; Murphy, Kendrah
Publication:
eprint arXiv:0908.0677
Publication Date:
08/2009
Origin:
ARXIV
Keywords:
Astrophysics - Instrumentation and Methods for Astrophysics, Astrophysics - High Energy Astrophysical Phenomena
Comment:
6 pages, 3 figures (2 color); to appear in proceedings of "The Coming of Age of X-ray Polarimetry"
Bibliographic Code:
2009arXiv0908.0677M

Abstract

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U -- all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors > 50% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.
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arXiv e-prints