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| Title: | Diffraction-based Sensitivity Analysis of Apodized Pupil-mapping Systems | |
| Authors: | Belikov, Ruslan; Kasdin, N. Jeremy; Vanderbei, Robert J. | |
| Affiliation: | AA(Mechanical and Aerospace Engineering, Princeton University, Engineering Quad, Princeton, NJ 08544; | |
| Publication: | The Astrophysical Journal, Volume 652, Issue 1, pp. 833-844. (ApJ Homepage) | |
| Publication Date: | 11/2006 | |
| Origin: | UCP | |
| ApJ Keywords: | Stars: Planetary Systems, Techniques: High Anular Resolution | |
| DOI: | 10.1086/507941 | |
| Bibliographic Code: | 2006ApJ...652..833B |
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