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Title:
Breaking the diffraction barrier - Optical microscopy on a nanometric scale
Authors:
Betzig, E.; Trautman, J. K.; Harris, T. D.; Weiner, J. S.; Kostelak, R. L.
Affiliation:
AA(AT&T Bell Laboratories, Murray Hill, NJ), AB(AT&T Bell Laboratories, Murray Hill, NJ), AC(AT&T Bell Laboratories, Murray Hill, NJ), AD(AT&T Bell Laboratories, Murray Hill, NJ), AE(AT&T Bell Laboratories, Murray Hill, NJ)
Publication:
Science (ISSN 0036-8075), vol. 251, March 22, 1991, p. 1468-1470.
Publication Date:
03/1991
Category:
Instrumentation and Photography
Origin:
STI
NASA/STI Keywords:
MICROSCOPY, OPTICAL MICROSCOPES, PHOTOMICROGRAPHS, WAVE DIFFRACTION, CONTRAST, HIGH RESOLUTION, NEAR FIELDS, SPATIAL RESOLUTION
DOI:
10.1126/science.251.5000.1468
Bibliographic Code:
1991Sci...251.1468B

Abstract

In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (lambda) is placed in close proximity (below lambda/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of about 12 nm (about lambda/43) and signals about 10,000- to one million-fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field microscopy appears poised to fulfill its promise by combining the power of optical characterization methods with nanometric spatial resolution.
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